IHP presentations worldwide
IHP presentations worldwide
since January 2008
Asia Pacific Microwave Conference 2008, Hong Kong, December 16-20, 2008, China
60 GHz Front-End Design in SiGe BiCMOS Technology
Y. Sun, S. Glisic (invited)
ICSICT 2008, 9th International Conference on Solid State and Integrated Circuit Technology, Beijing, October 20-23, 2008, China
Atomically Controlled CVD Processing for Future Si-Based Devices
J. Murota, M. Sakuraba, B. Tillack (invited)
Meeting of the ECS, Symposium E15-E23, Honolulu, October 12-17, 2008, Hawaii
SiGe:C BiCMOS Technologies for Automotive Radar Applications
G.G. Fischer, S. Glisic, B. Heinemann, W. Winkler (invited)
IEEE International Symposium on Personal, Indoor and Mobile Radio Communication (PIMRC), Cannes, September 15-18, 2008, France
60 GHz OFDM System Demonstrators in SiGe BiCMOS: State-of-the-Art and Future Development
Ch.-S. Choi, E. Grass, F. Herzel, M. Piz, K. Schmalz, Y. Sun,. S. Glisic, M. Krstic, K. Tittelbach-Helmrich, M. Ehrig, W. Winkler, R. Kraemer, J.C. Scheytt (invited)
IEEE International Conference on Ultra-Wideband 2008 (ICUWB 2008), Hannover, September 10-12 2008, Germany
A High Band Non-Coherent Impulse Radio UWB Receiver
O. Klymenko, G. Fischer, D. Martynenko (invited)
ESRF Experimental Division Meeting, Grenoble July 22, 2008, France
Engineered Wafer Systems: On the Global Integration of 100% Germanium Layers on Soilicon via Oxide
A. Giussani, T. Schroeder (invited)
Nanoscale VI, Berlin, July 09-11, 2008, Germany
Optical Spectroscopy in Combination with Atomic Force Microscopy for Silicide Stack Characterization
O. Fursenko, J. Bauer, D. Bolze, I. Costina, G. Weidner
Netzwerktreffen der DiagnostikNet-BB e.V., Berlin, July 08,2008
Ein Werkzeugkasten der Mikroelektronik für die Diagnostik
M. Birkholz
8th International ALD Conference, Bruges, June 29 - July 02, 2008, Belgium
Atomically Controlled Processing for Impurity Doping in Si-Based CVD Epitaxial Growth
J. Murota, M. Sakuraba, B. Tillack (invited)
15th Workshop on Dielectrics in Microelectronics, WODIM 2008, Bad Saarow, June 23-25, 2008, Germany
The Influence of the Electrode Material on HfO2 MIM Capacitors
M. Lukosius, Ch. Wenger, H.-J. Müssig, G. Ruhl, S. Pasko, Ch. Lohe
BMBF Statusseminar Mobile Kommunikation, Freiburg, June 18-19, 2008, Germany
Vollintegrierter frequenzagiler Synthesizer mit niedrigem Phasenrauschen
S.A. Osmany, J.C. Scheytt
High Frequency Modulator for Class-S Amplifier
P. Ostrovskyy, H. Gustat, J.C. Scheytt
15th International Conference on Telecommunication, St. Petersburg, June 18, 2008, Russia
Systems Engineering in a Converging World
P. Langendörfer, D. Dietterle, St. Peter (invited)
Workshop on International Microwave Symposium 2008, Atlanta, June 15-20 2008, USA
An Impulse Radio UWB Transceiver with Time-of-Arrival Measurment Extension
G. Fischer, O. Klymenko, D. Martynenko (invited)
Various Implementations of a Heading Module for an Optical Positioning System
O. Maye, M. Maaser, F. Herzel (invited)
Institutskolloquium des IKZ, Berlin, June 13, 2008, Germany
Halbleitermaterialien für die Biotechnologie
M. Birkholz (invited)
3rd Sino-German Workshop, Hangzhou, June 09-14, 2008, China
Engineered Mixed Buffer Oxide Heterostructures for the Global Integration of Germanium on Silicon
T. Schroeder (invited)
Elektrotechnisches Kolloquium SS 2008, Stuttgart, June 03, 2008, Germany
SiGe BiCMOS Technologien für Höchstfrequenzanwendungen
B. Tillack (invited)
WWIC, Tampere, May 28-30, 2008, Finland
An Encryption-Enabled Network Protocol Accelerator
St. Peter, M. Zessack, F. Vater, G. Panic, H. Frankenfeldt, M. Methfessel
E-MRS Spring Meeting, Strasbourg, May 26-30, 2008, France
Quantitative Determination of Fiber Texture Gradients in Thin ZnO:Al Films
M. Birkholz, N. Darowski, I. Zizak
Structural Characterization of 2D Protein Crystals on Semiconductors by Grazing-Incidence
M. Birkholz, I. Zizak, N. Darowski, I. Wallat, H. Otto, M.P. Heyn
Raman Spectroscopy of Protein-Semiconductor Materials Hybrids
S. Kouteva-Arguirova, M. Birkholz, I. Wallat, M.P. Heyn, J. Reif
13th IEEE European Test Symposium, Verbania, May 25-29, 2008, Italy
Scan-Through-TAP: Combining Scan Chain and Boundary Scan Features in SOC
Z. Stamenkovic, M. Giles, F. Russi
3rd IEEE Microwave and Radar Week (MIKON 2008), Wroclaw, May 19-23, 2008, Poland
Ultra High-Speed Wireless Communication in the 250-300 GHz Band
R. Kraemer (invited)
A 40 GBit/s Transimpedance Amplifier in 0.25 nm SiGe Technology with Ultra Low Consumption
S. Hauptmann, D. Schoeniger, R. Eickhoff, F. Ellinger, J.C. Scheytt
8th International Workshop on Junction Technology (IWJT2008), Shanghai, May 15-16, 2008, China
Process Models for Advanced Annealing Schemes and their Use in Device Simulation
P. Pichler, A: Martinez-Limia, C. Kampen, A. Burenkov, H. Schermer, S. Paul, W. Lerch, J. Gelpey, S. McCoy, H. Kheyrandish, A. Pakfar, C. Tavernier, D. Bolze (invited)
ISTDM 2008, Hsinchu, May 11-14, 2008, Taiwan
Global Integration of 100% Ge Layers on Si via Oxide Heterostructures
T. Schroeder (invited)
Heavy B Atomic-Layer Doping Characteristics in Si Epitaxial Growth on B Adsorbed Si(100) by Ultraclean Low-Pressure CVD System
H. Tanno, M. Sakuraba, B. Tillack, J. Murota (invited)
Materials Research Seminar at Nanotechnology Center of University, Halle, May 07, 2008, Germany
From Stacking Twins and Microtwins: Suppressing Defects in epitaxial Ge (111) / Insulator / Si(111) Heterostructures
T. Schroeder (invited)
IEEE International Symposium on Wireless Pervasive Computing (ISWPC 2008), Santorini, May 07-09, 2008, Greece
Power Gating in Wireless Sensor Networks
G. Panic, Z. Stamenkovic, R. Kraemer
NGI 2008, 4th Euro-NGI Conference on Next Generation Internet Networks, Krakow, April 28-30, 2008, Poland
A Wireless Sensor Network Reliable Architecture for Intrusion Detection
P. Langendörfer, A. Grilo, K. Piotrowski, A. Casaca
Semiconductor Conference Dresden, April 24, 2008, Germany
SiGe Frontends for Short-Range Wireless Communication at 60 GHz and Beyond
J.C. Scheytt (invited)
PhD Symposium, Szklarska Poreba, April 23-25, 2008, Polska
Atomic Vapor Depositions Metal-Insulator-Metal Stacks
M. Lukosius, Ch. Wenger, H.-J. Müssig, S. Pasko, Ch. Lohe
11th IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems, Bratislava, April 18-19, 2008, Slovakia
A System-on-Chip for Wireless Body Area Sensor Network Node
Z. Stamenkovic, G. Panic, G. Schoof
5th External Collaboration Workshop, Quimonda, Dresden, April 17, 2008, Germany
MBE Deposition of Hf-based High-K Dielectrics: BaHfO3 and SrHfO3
G. Lupina, P. Dudek, G. Kozlowski, J. Dabrowski, G. Lippert, P. Zaumseil, H.-J. Müssig
Seminar at Wolfen Solar Valley/Thalheim, April 15, 2008, Germany
Optimization of Antireflection Coatings for Solar Cells
J. Bauer, K. Hehl, J. Bischoff, J. Schneider, O. Fursenko (invited)
Chinese University of Hong Kong, Department of Electronic Engineering, April 2008, Hong Kong
SOC Design and Configurable Processors
Z. Stamenkovic
WPNC 2008, Hannover, March 27, 2008, Germany
Performance of UWB and its Suitability for Wireless Sensor Networks
S. Olonbayar, R. Kraemer
1st International Workshop of Interoperable Vehicles (Internet of Things 2008), Zurich, March 26-28, 2008, Switzerland
Extension of the Rice Channel Model for Deterministic Consideration of Obstacles in Urban Traffic Scenarios
St. Hiebel
MRS Spring Meeting 2008, San Francisco, March 24-28, 2008, USA
Efficiency of Damage Annealing in Advanced Ultra-Shallow Junction Processing
P.J. Timans, S. McCoy, J. Gelpey, W. Lerch, S. Paul, D. Bolze, H. Kheyradish
Functional Oxides for the Integration in Micro- and Nanoelectronics, Autrans, March 16-19, 2008, France
On the Interaction of High-k Oxides with Semiconductors: The Example of Ge Heteroepitaxy on Single Crystalline PrO2 Si(111) Support Systems
T. Schroeder (invited)
The Role of the High K Dielectric Ti-N Interface in Voltage Nonlinearities of Metal-Insulator-Metal Capacitors
Ch. Wenger (invited)
9th Conference on Ultimate Integration on Silicon, ULSI 2008, Udine, March 12-14, 2008, Italy
Dielectrics Characteristics of Amorphous and Crystalline BaHfO3 High-k Layers on TiN for Memory Capacitor Applications
G. Lupina, G. Kozlowski, P. Dudek, J. Dabrowski, Ch. Wenger, P. Zaumseil, G. Lippert, H.-J. Müssig
DPG-Frühjahrstagung Darmstadt, March 10-14, 2008
A New Dry Etch Chemistry in Deep Trench Silicon Plasma Etching for Sub - 100 nm Technologies
H.H. Richter, S. Günther, S. Wege, S. Barth, I. Costina, G. Weidner, S. Marschmeyer, H. Silz
Workshop Analog Integrated Circuits, Berlin, March 10-11, 2008, Germany
Design of a High Frequency Bandpass Delta-Sigma Modulator
P. Ostrovskyy, H. Gustat, J.C. Scheytt, M. Ortmanns, Y. Manoli
Frequency Synthesizer for Multi-Band Multi-Standard Base Station Application
S.A. Osmany, J.C. Scheytt
SIMUTools 2008, 1st International Conference on Simulation Tools and Techniques for Communications, Networks and Systems, Marseille, March 03-07, 2008, France
Embedded System Protocol Design Flow Based on SDL: From Specification to Hardware / Software Implementation
D. Dietterle
DPG Frühjahrstagung Berlin, February 25-29, 2008, Germany
MIM Capacitors for Wireless Communication Technologies
Ch. Wenger (invited)
Profiling of Fiber Texture Gradients by Anomalous X-Ray Diffraction
M. Birkholz, N. Darowski, I. Zizak (invited)
Lattice Engineering of Dielectric Heterostructures on Si by Isomorphic Oxide - on – Oxide Epitaxy
A. Wilke, O. Seifarth, I. Costina, R. Sohal, P. Zaumseil, N. Pascual, H.-J. Müssig, T. Schroeder
100% epi-Ge Layers on Engineered Oxide Heterostructures on Si
P. Rodenbach, A. Giussani, J.I. Pascual, P. Storck, D. Geiger, H. Lichte, T. Schroeder
Atomic Vapour Deposition of Sr-Ta-O Films for MIM Applications
M. Lukosius
Current Transport Mechanism in Metal/HfO2/Metal Structures
Ch. Walczyk
Evaluating Electrostatic Force Microscopies for the Investigation of Near-Surface Dopant Distributions in Silicon
M. Ratzke, M. Birkholz, J. Bauer, D. Bolze, J. Reif
Quantitative Determination of Dopant Distributions by Electrostatic Force Microscopy
M. Ratzke, M. Birkholz, J. Bauer, D. Bolze
On the Electronic and Dielectric Characterization of Thin Cubic PrO2 Layers on Silicon
O. Seifarth, C. Walczyk, G. Lupina, J. Dabrowski, G. Weidner, P. Zaumseil, D. Schmeißer, P. Storck, H.J. Müssig, T. Schroeder
Preparation and Tunneling Characteristics of MOS Structures for Si-based IR Light Emitters
St. Suckow, M. Kittler, W. Seifert, T. Arguirov, M. Schmidt, B. Stegemann, H. Angermann
The Influence of Image Potential on Defect Assisted Leakage Mechanisms
G. Kozlowski, J. Dabrowski
The Mechanisms of Leakage Current in BaHfO3 Films
G. Kozlowski, J. Dabrowski, G. Lupina, G. Lippert, P. Dudek, H.-J. Müssig
Transition Metal Oxide Based NVM for IHP's 0.13 µm BiCMOS Technology
R. Sohal, Ch. Walczyk, P. Zaumseil, T. Schroeder
SPIE Advanced Lithography, San Jose, February 24-29, 2008, USA
100nm Half - Pitch Double Exposure KrF Lithography Using Binary Masks
S. Geisler, J. Bauer, U. Haak, D. Stolarek, K. Schulz, H. Wolf, W. Meier, M. Trojahn, E. Matthus
Mitteldeutscher Technologietag Jena, February 18-19, 2008, Germany
Mikroelektronische Sensorentwicklungen für Medizin und Biotechnologie
M. Birkholz
The 1st International Conference on MOBILe Wireless Middle WARE, Operating Systems, and Applications, Innsbruck, January 30 - February 02, 2008, Austria
Privacy Guaranteeing Execution Containers: One Time use of Personal Data by Location Based Services
P. Langendörfer, M. Maaser
1. Deutscher Kongress Ambient Assisted Living, Berlin, January 30 - February 01, 2008, Germany
Drahtlose Heimvernetzung mit Unterstützung von Dienstgüte und Heimsteuerung
R. Kraemer, M. Methfessel, K. Tittelbach-Helmrich, R. Kays, Ch. Schilling
Silicon Monolithic Integrated Circuits in RF Systems (SiRF 2008), Orlando, January 23-25, 2008, USA
A Fully Integrated 48-GHz-Low-Noise PLL with a Constant Loop Bandwidth
F. Herzel, S. Glisic, S. Osmany, J.C. Scheytt, K. Schmalz, M. Engels
Temperature Stability and Reliability Aspects of 77 GHz Voltage Controlled Oscillators in a SiGe:C BiCMOS Technology
G.G. Fischer, S. Glisic
A Compact Low-Power SiGe:C BiCMOS Amplifier for 77-81 GHz Automotive Radar
B. Schleicher, S. Chartier, G.G. Fischer, F. Korndörfer, J. Borngräber, T. Feger, H. Schumacher
High Voltage Complementary Epi Free LDMOS Module with 70 V PLDMOS for a 0.25 µm SiGe:C BiCMOS Platform
R. Sorge, A. Fischer, K.-E. Ehwald, R. Barth, P. Ostrovsky, R. Pliquett, K. Schulz, D. Bolze, P. Schley, D. Schmidt, H.-E. Wulf, H. Grützediek, J. Scheerer, P. Hartmetz
HASYLAB User's Meeting, Hamburg, January 25, 2008, Germany
Heteroepitaxial Ge Layers on Single Crystalline PrO2(111) / Si(111) Support Systems: An In-situ Growth Study and an ex-situ Structural Investigation by SR-GIXRD
A. Giussani, O. Seifarth, P. Rodenbach, T. Weisemöller, C. Deiter, J. Wollschläger, P. Storck, H.-J. Müssig, P. Zaumseil, T. Schroeder
IHP-NNFC Workshop, Daejeon, January 22, 2008, Korea
Back end Integration of Advanced Dielectrics
Ch.Wenger
Embedded Flash Memory Integration into BiCMOS
A. Fox
IHP BiCMOS Technology for High Speed Applications
R.F. Scholz
Heteroepitaxial Approaches on Silicon
T. Schroeder
The 24th European Mask and Lithography Conference EMLC 2008, Dresden, January 21-24, 2008, Germany
Double Exposure Technology for KrF Lithography
S. Geisler, J. Bauer, U. Haak, D. Stolarek, K. Schulz, H. Wolf, W. Meier, M. Trojahn, E. Matthus, H. Beyer, St. Marschmeyer, B. Kuck
Optical Proximity Correction for 0.13 µm SiGe:C BiCMOS
S. Geisler, J. Bauer, U. Haak, U. Jagdhold, R. Pliquett, E. Matthus, R. Schrader, H. Wolf, U. Baetz, H. Beyer, M. Niehoff
Workshop „MegaEpos – Logik“, Dresden, January 21, 2008, Germany
Investigation of Growth Conditions of Ba-Hafnate on its Structure
G. Lippert, P. Zaumseil, P. Dudek, G. Lupina, H.-J. Müssig
Pulsed Laser Deposition as a method for Materials Screening -Deposition of SrHfO3 and SrTa2O6
G. Lupina
Photonics West, Silicon Photonics III Conference, San Jose, January 19-24, 2008, USA
Stark Effect at Dislocations in Si for Modulation of a 1.5 µm Light Emitter
M. Kittler, M. Reiche, T. Mchedlidze, T. Arguirov, G. Jia, W. Seifert, S. Suckow, T. Wilhelm