Radhard RF and digital circuits for reliability critical applications
Research activities for reliable digital and RF circuits for space applications have a long tradition. The major focus of this investigation is on radiation hard by design (RHBD) methodology for digital and RF circuits. In this respect the circuit level methods for addressing TiD effects are applied, such as consistent use of the ELT transistors, following special design rules, etc. With respect to SEEs, the design flow is elaborated enabling the implementation of complex digital circuits with the use of radiation hard library and additional design steps enhancing tolerance to SETs and SEUs. Moreover, there is a strong expertise in selective fault tolerance methodology, which enables the optimization of the required overhead for achieving required fault tolerance level. Finally, the expertise in the related area is present at different abstraction and complexity levels, from simple interface circuits up to the complex mixed-signal systems.