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QLO – Long Term Stress Tests

Lifetime assessment under HCI degradation at room temperature of active devices in SGB25RH PDK

Zielstellung

To verify the relationship between DC and dynamic degradation of CMOS and HBT devices due to HCI at room temperature and extrapolate lifetime under dynamic regime.

Beitrag des IHP

  • Design and Development of Dynamic Evaluation Circuit (DEC) Test Vehicle
  • Performing Dynamic Long Term Stress Tests (+2000 hours)
  • Test Data Analysis

Finanzierung

This project has received funding from DLR-RFM under Contract Nº 50PS0705.

Projektpartner

  • OHB  GmbH (ex Kayser-Threde), Germany (Prime Contractor/Coordinator)
  • Micross Components (UK)
Das Gebäude und die Infrastruktur des IHP wurden finanziert vom Europäischen Fonds für regionale Entwicklung, von der Bundesregierung und vom Land Brandenburg.