Scope of the conference
The GADEST conference (Gettering and Defect Engineering in Semiconductor
Technology) covers a broad range of topics - from theoretical analysis toward
practical engineering solutions - that makes this meeting unique in the field.
The purpose of the conference is to provide a forum for interactions between
scientists and engineers engaged in the field of semiconductor defect
physics, materials science and technology.
Fundamental aspects as well as technological problems associated with defects
in electronic materials and devices will be addressed, ranging from micro-
and nanoelectronics to photovoltaics. The conference will offer ample time
for discussion and informal interactions between scientists and engineers
coming from all over the world and representing different disciplines. This
will ensure a lively exchange of opinions and may lead to a better understanding
of the complex aspects of defect engineering which over the years was starting
to shift from art into real science.
The strengthening of the interactions and exchanges between the communities
working in the fields of crystalline silicon for micro/nanoelectronics and
photovoltaics is a special ambition of the forthcoming GADEST conference.