Advanced Characterization & diagnostics

Advanced equipment for DC and RF characterization of individual components up to functional measurement of complex ASICs is supported within this competence area. This includes, for example, the measurement of scattering parameters (S-parameters) up to 110 GHz on state-of-the-art RF transistors. Furthermore, electro-optical as well as purely optical measurements of photonic passive and active RF devices on wafer level are investigated. These capabilities are complemented by a broad portfolio of equipment for material analysis and diagnostics of devices and semiconductors as well as for specific circuit manipulation.