Digital- and Mixed-Signal SoC Test Service

Facilities for Functional Test on Integrated Circuits

Production Test System - Advantest 93000

Power supply:
2xGP-DPS: 4 ch., max 16 A, ±8 V force/measure
MS-DPS: 8 ch., max 16 A, ±8 V force/measure
DPS32: 32 ch., max 48 A @ 3 V, 0-7 V force/measure
digital resources:
2xPS1600: 256 ch. @ 533 Mb/s, 32 ch. @ 1.6 Gb/s
1xPS9G: 64 ch. @ 800 Mb/s, 32 ch. @ 8 Gb/s
1xPSSL: 16 ch. @ 16 Gb/s

Analog resources:
MBAV8+:
Source 4 AWG, max 200 MHz @ 500 Ms/s
Measure 4 Digitizers, max 16 bit @ 300 MHz
V-Source, PMU, HPPMU multiplex

Additional software for memory test and scan test analysis
Supports manual package test and automatic wafer test (using the UF200 wafer prober)

Accretech UF200 wafer prober
Fully automatic wafer prober for up to 25 wafers/lot
Supports 6inch and 8inch wafers
Temperature controlled chuck, -40°C up to +125°C

Prof. Miloš Krstić

Department Head

IHP
Im Technologiepark 25
15236 Frankfurt (Oder)
Germany

Secretary:
Heike Wasgien
Phone: +49 335 5625 342
Fax: +49 335 5625 671
Send e-mail »

Debugging Test System

MuTest

pre-series & medium scale
volume production tester
radiation test
power supply
- 8 channels with 800 mA
- 2 channels with 5 A
- Voltage range -4 V to 10 V
digital resources
- 4xM-D864: 256 ch @ 800 Mb/s
- voltage range -1.5 V to 6.5 V

Binder MK 53 E2

climate chamber for endurance tests
temperature range: 40 ° to 150 °C
fully programmable & remotely controllable

Thermostream TP04300

mobile programmable temperature system
temperature performance:
- Range: -75 ° to 228 °C
- Transition: ±180 °C in < 10 s
- Accuracy: 1 °C
DUT temperature sensors