IHP’s PhD student Tommaso Rizzi received the Best Student Paper Award at the renowned IEEE International Integrated Reliability Workshop 2022, taking place at the Stanford Sierra Conference Center in Fallen Leaf Lake, USA. He presented his work "Exploring Process-Voltage-Temperature Variations Impact on 4T1R Multiplexers for Energy-aware Resistive RAM-based FPGAs" as a result of a long-term collaboration between IHP, Università degli Studi di Ferrara and Politecnico di Milano, Italy.
According to Tommaso Rizzi, RRAM devices can find an appealing application in the interconnect fabric of modern FPGAs bringing considerable improvement in terms of energy consumption and speed. The promising results achieved in this work is an importatnt step towards the future of this technology and bring us closer to the real implementation of an energy-efficient RRAM-based FPGA capable of adapting its programming procedure based on its operating conditions and the target environment. This kind of architecture may be a viable alternative to the current state of the art implementation in particular for internet of things (IoT) and edge computing applications.
The IEEE International Integrated Reliability Workshop (IIRW) focuses on ensuring electronic device reliability through fabrication, design, testing, characterization and simulation, as well as identification of the defects and physical mechanisms responsible for reliability problems.
The Best Student Paper Award was presented after the event.
